ترجمه برق- 30 اسلاید (ترجمه پاور پورینت شده و آماده ارائه می باشد)
سال 2015
Strongly Secure Scan Design Using Generalized Feed Forward Shift Registers
طراحی کاملا امن پویش با استفاده از ثبات های پیش خورد ( فید فوروارد ) تغییر
Hideo FUJIWARA, Katsuya FUJIWARA
https://www.jstage.jst.go.jp/article/transinf/E98.D/10/E98.D_2015EDL8100/_article
دانلود رایگان مقاله انگلیسی
چکیده
In our previous work [12], [13], we introduced generalized feed-forward shift registers (GF2SR, for short) to apply them to secure and testable scan design, where we considered the security problem from the viewpoint of the complexity of identifying the structure of GF2SRs. Although the proposed scan design is secure in the sense that the structure of a GF2SR cannot be identified only from the primary input/output relation, it may not be secure if part of the contents of the circuit leak out. In this paper, we introduce a more secure concept called strong security such that no internal state of strongly secure circuits leaks out, and present how to design such strongly secure GF2SRs.
منابع
[1] H. Fujiwara, Logic Testing and Design for Testability, The MIT Press, 1985.
[2] K. Hafner, H.C. Ritter, T.M. Schwair, S. Wallstab, M. Deppermann, J. Gessner, S. Koesters, W. Moeller, and G. Sandweg, “Design and test of an integrated cryptochip,” IEEE Design and Test of Computers, vol.8, no.4, pp.6-17, Dec. 1991.
[3] D. Hély, F. Bancel, M.-L. Flottes, and B. Rouzeyre, “Securing scan control in crypto chips,” Journal of Electronic Testing-Theory and Applications, vol.23, no.5, pp.457-464, Oct. 2007.
[4] B. Yang, K. Wu, and R. Karri, “Secure scan: A design-for-test architecture for crypto chips,” IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol.25, no.10, pp.2287-2293, 2006.
[5] J. Lee, M. Tehranipoor, C. Patel, and J. Plusquellic, “Securing designs against scan-based side-channel attacks,” IEEE Trans. Dependable and Secure Computing, vol.4, no.4, pp.325-336, 2007.
[6] S. Paul, R.S. Chakraborty, and S. Bhunia, “VIm-Scan: A low overhead scan design approach for protection of secret key in scan-based secure chips,” Proc. 25th IEEE VLSI Test Symposium, pp.455-460, 2007.
[7] G. Sengar, D. Mukhopadhyay, and D.R. Chowdhury, “Secured flipped scan-chain model for crypto-architecture,” IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, vol.26, no.11, pp.2080-2084, Nov. 2007.
[8] U. Chandran and D. Zhao, “SS-KTC: A high-testability low-overhead scan architecture with multi-level security integration,” Proc. 27th IEEE VLSI Test Symposium, pp.321-326, 2009.
[9] M.A. Razzaq, V. Singh, and A. Singh, “SSTKR: Secure and testable scan design through test key randomization,” Proc. 20th IEEE Asian Test Symposium, pp.60-65, 2011.
[10] H. Fujiwara and M.E.J. Obien, “Secure and testable scan design using extended de Brujin graph,” Proc. 15th Asia and South Pacific Design Automation Conference, pp.413-418, 2010.
[11] K. Fujiwara, H. Fujiwara, and H. Tamamoto, “Secure and testable scan design utilizing shift register quasi-equivalents,” IPSJ Trans. System LSI Design Methodology, vol.6, pp.27-33, 2013.
[12] K. Fujiwara and H. Fujiwara, “WAGSR: Web application for generalized feed forward shift registers,” Proc. 13th IEEE Workshop on RTL and High Level Testing, pp.1.2.1-1.2.7, 2012.
[13] K. Fujiwara and H. Fujiwara, “Generalized feed-forward shift registers and their application to secure scan design,” IEICE Trans. Inf. & Syst., vol.E96-D, no.5, pp.1125-1133, 2013.
Cited by :
Hideo FUJIWARA, Katsuya FUJIWARA. Properties of Generalized Feedback Shift Registers for Secure Scan Design. IEICE Transactions on Information and Systems. 2016, Vol.E99.D, No.4, p.1255.
Hideo FUJIWARA, Katsuya FUJIWARA. Realization of SR-Equivalents Using Generalized Shift Registers for Secure Scan Design. IEICE Transactions on Information and Systems. 2016, Vol.E99.D, No.8, p.2182.
Hideo FUJIWARA, Katsuya FUJIWARA. Synthesis and Enumeration of Generalized Shift Registers for Strongly Secure SR-Equivalents. IEICE Transactions on Information and Systems. 2017, Vol.E100.D, No.9, p.2232.